Ultra Start 26XX Series Manual de instrucciones descargar pdf (Pagina 12)

A Wealth of Applications

Thickness Measurements of Cling Films

Band Gap Measurements for

Compound Semiconductors

DNA and Protein Measurements

Electricity, Electronics,

and Optics

Chemicals

Life Sciences

The diffuse reflection spectra for two types of compound

semiconductors (red line: Culn

0.5

, blue line: CulnSe

) used as

solar cell materials have been measured using the ISR-2600Plus

integrating sphere. It is evident that the absorption edge (position

where the reflectance drops) differs depending on the sample. This

difference signifies a difference in the band gap* for these samples.

(The samples were provided by Wada Laboratory, Faculty of Science

and Technology, Ryukoku University.)

The band gaps for the samples were calculated utilizing the Tauc

method. The results obtained were 1.27 eV for Culn

0.5

(red

line) and 0.99 eV for CulnSe

(blue line).

* The term band gap refers to the energy difference between the top of the valence band,

which is full of electrons, and the bottom of the conduction band, which does not contain

electrons.

Undulating interference waveforms sometimes occur if light is passed

through a film. The film thickness of a sample can be determined by

using these interference waveforms. The figure shows transmittance

data for a cling film. A clear interference waveform is produced.

Utilizing optional film thickness measurement software, the film

thickness is calculated as 10.4 μm.

(Caution) The sample's refractive index must be entered for the film

thickness calculation.

The red and blue lines are the absorption spectra for dsDNA and BSA

(bovine serum albumin), respectively.

The concentration values are 45 ng/μL for dsDNA and 2.2 mg/mL for

BSA.

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Ultra Start 26XX Series Manual de instrucciones Pagina 12