Ultra Start 26XX Series Manual de instrucciones descargar pdf (Pagina 17)

Color Measurement Software

This software calculates color values of the measurement sample from the spectrum measured.

This software measures the thickness of thin films from the wavelengths of peak (or valley) interference waveforms overlapping the spectrum.

The film thickness is measured through optical methods without physical contact.

Calculable Items

Tristimulus value (XYZ), chromaticity coordinates (xy), Hunter color coordinate system/color difference formula, CIELAB color coordinate system/color difference formula, CIELUB color

coordinate system/color difference formula, yellowness/after-yellowing, whiteness, whiteness B (blue reflectance), Munsell, metamerism, three attributes from CIELUB and their difference,

primary wavelength, excitation purity

The software is fully equipped with convenient graphic functions including chromaticity diagrams and enlarged color-difference views.

It provides a wealth of recalculation functions, enabling items and conditions with

respect to the spectra obtained to be changed for recalculation.

The visual field (2°, 10°) and the illumination (A, B, C, D65, F6, F8, and F10) are

freely selectable. In addition, the user can configure particular weighting coefficients,

enabling calculations with respect to any illumination. The configured illumination

can also be saved.

Standard white plate values can be configured, enabling corrected calculations.

Standard samples can be freely specified, enabling color-difference calculations.

Thickness conversion calculations are possible with respect to glass, filters, and other

transmissive materials.

The average and standard deviation of multiple data points can be calculated.

Up to 100 data points can be shown.

OS: Windows 7 Professional/Vista Business

(Cat. No. 206-65207)

Film Thickness Measurement Software

(Cat. No. 206-65206)

Lab chromaticity diagram display window

Measurement window

The film thickness is calculated from linear regression by applying the method of

least squares to the wavelengths of the multiple peaks and valleys automatically

detected. (The thin film's refractive index and the angle of incidence must be

configured as calculation conditions.)

The calculation conditions can be changed with respect to the measured spectra,

enabling recalculation.

A range can be set for use in the calculations while checking the spectral interfer-

ence waveform onscreen.

The measurable film thickness range is (minimum measured wavelength)/n to 50 ×

(maximum measured wavelength)/n. (Reference value)

OS: Windows 7 Professional/Vista Business

Recalculation window

Recalculat

n win

dow

1 2 ... 12 13 14 15 16 17 18 19 20 21 22 ... 27 28

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Ultra Start 26XX Series Manual de instrucciones Pagina 17

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